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View all- Kinseher JZordan LPolian ILeininger AFanucci LTeich J(2016)Improving SRAM test quality by leveraging self-timed circuitsProceedings of the 2016 Conference on Design, Automation & Test in Europe10.5555/2971808.2972034(984-989)Online publication date: 14-Mar-2016
- Lin CYang HHuang CChen HChao MPhillips JHu AGraeb H(2011)Detecting stability faults in sub-threshold SRAMsProceedings of the International Conference on Computer-Aided Design10.5555/2132325.2132332(28-33)Online publication date: 7-Nov-2011
- Krishna ANarasimhan SWang XWang X(2011)MECCAProceedings of the 13th international conference on Cryptographic hardware and embedded systems10.5555/2044928.2044964(407-420)Online publication date: 28-Sep-2011