We propose a new, large-scale, logic TEG, which is called flip-flop RAM (FF-RAM), to improve the total process quality before and during initial mass ...

We propose a new, large-scale, logic TEG, which is called flip-flop RAM (FF-RAM), to improve the total process quality before and during initial mass ...

We propose a new large-scale logic test element group (TEG), called a flip-flop RAM (FF-RAM), to improve the total process quality before and during initial ...

A Large-Scale, Flip-Flop RAM Imitating a Logic LSI for Fast Development of Process Technology. Authors. Masako FUJII; Koji NII; Hiroshi MAKINO; Shigeki ...

A large scale, flip-flop RAM imitating a logic LSI for fast development of process technology. M. Fujii*, K. Nii, H. Makino, S. Ohbayashi, M. Igarashi, T ...

Dive into the research topics of 'A large-scale, flip-flop RAM imitating a logic LSI for fast development of process technology'. Together they form a unique ...

We propose a new large-scale logic test element group (TEG), called a flip-flop RAM (FF-RAM), to improve the total process quality before and during initial ...

Summary: We propose a new large-scale logic test element group (TEG), called a flip-flop RAM (FF-RAM), to improve the total process quality before and during ...

A Large-Scale, Flip-Flop RAM Imitating a Logic LSI for Fast Development of Process Technology : Microelectronic test structures (ICMTS2007) ; Oxford University ...

ICMTS Best Papers ; 2007, A Large Scale, Flip-Flop RAM imitating a logic LSI for fast development of process technology. M. Fujii, K. Nii, H. Makino, S.