An incomplete scan design approach to sequential test generation is presented. This approach represents a significant departure from previous methods.

An Incomplete Scan Design Approach to Test Generation for. Abstract. Sequential Machines. Hi-Keung Tony Ma, Srinivas Devadas,. A. Richard Newton and Alberto ...

An incomplete scan design approach to test generation for sequential machines. Ma H.-., Devadas S., Newton A.R., Sangiovanni-Vincentelli A.

Oct 4, 2024 · An Incomplete Scan Design Approach to Test Generation for Sequential Machines. January 1988 · IEEE International Test Conference (TC). A.

Bibliographic details on An Incomplete Scan Design Approach to Test Generation for Sequential Machines.

... an incomplete scan design approach to generate tests for very large sequential circuits ... Computer Science, Engineering. Design Automation Conference. 1978.

TEST GENERATION FOR SEQUENTIAL CIRCUITS. 1093 an incomplete scan design approach to test generation. In this approach, the test generation algorithm is first ...

Sangiovanni-Vincentelli, "An incomplete scan design approach to test generation for sequential machines," in Proc. Int. Test Conf., 1988, pp. 730- 734 ...

The scan design is the most widely used technique used to ensure the testability of sequential circuits. In this article it is shown that testability is ...

A new method which identifies justification and propagation requirements of aborted faults through combinational test generation and selects flip-flops to ...