Sep 28, 2022 · In our study, a local property analysis-based approach is proposed for wafer map failure pattern recognition. We extracted three types of local ...

Sep 28, 2022 · The combination of feature extraction and classification methods is an often used approach for wafer map failure pattern recognition.

The combination of feature extraction and classification methods is an often used approach for wafer map failure pattern recognition.

Sep 7, 2022 · The combination of feature extraction and classification methods is an often used approach for wafer map failure pattern recognition.

Co-authors ; CNN and ensemble learning based wafer map failure pattern recognition based on local property based features. M Piao, CH Jin. Journal of Intelligent ...

CNN and ensemble learning based wafer map failure pattern recognition based on local property based features · Minghao PiaoC. Jin. Computer Science ...

The objective of this paper is to propose a systematic failure pattern recognition for wafer map based on neural networks. A deep convolutional neural ...

In this paper, we proposed a decision tree ensemble learning based wafer map failure pattern recognition method based on radon transform based features.

May 19, 2023 · This deep learning-based method follows two steps: First, the deep learning framework is simply applied to the wafer map defect pattern problem; ...

CNN and ensemble learning based wafer map failure pattern recognition based on local property based features. Journal of Intelligent Manufacturing.