Dec 23, 2013 · Experiments with large benchmark and industrial circuits show that CPS-BIST can achieve capture power safety with negligible impact on both test ...

Oct 10, 2014 · SUMMARY. The applicability of at-speed scan-based logic built-in self-test (BIST) is being severely challenged by excessive capture power.

This paper is the first that has explicitly focused on achieving capture power safety with a practical scheme called capture-power-safe BIST (CPS-BIST).

Experiments with large benchmark and industrial circuits show that CPS-BIST can achieve capture power safety with negligible impact on both test quality and ...

Experiments with large benchmark and industrial circuits show that CPS-BIST can achieve capture power safety with negligible impact on both test quality and ...

Oct 1, 2014 · Different from conventional low-power BIST, this paper is the first to explicitly focus on achieving capture power safety with a novel and ...

Bibliographic details on On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST.

On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST ; 巻: E97D ; 号: 10 ; 開始ページ: 2706 ; 終了ページ: 2718 ; 記述言語: 英語 ...

The applicability of at-speed scan-based logic built-in self-test (BIST) is being severely challenged by excessive capture power that may cause erroneous ...

This paper proposes a novel scheme to manage capture power in a pinpoint manner for achieving guaranteed capture power safety, improved small-delay test ...