"Machine Learning based Scan Chain Diagnosis for Double Faults."

Hyojoon Yun, Tae-Hyun Kim, Sungho Kang (2023)

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DOI: 10.1109/ISOCC59558.2023.10396107

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-15

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Hyojoon Yun, Tae-Hyun Kim, Sungho Kang:
Machine Learning based Scan Chain Diagnosis for Double Faults. ISOCC 2023: 341-342

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