"On-Line Measurement of Chip Temperature Based on Blocking Leakage Current ..."

Jinyuan Li et al. (2021)

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DOI: 10.1109/ACCESS.2021.3057538

access: open

type: Journal Article

metadata version: 2024-10-06

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Jinyuan Li, Yunong Liu, Yaosheng Li, Zhongyuan Chen, Chunsheng Guo, Hao Li:
On-Line Measurement of Chip Temperature Based on Blocking Leakage Current of the Insulated-Gate Bipolar Transistor Module in the High-Temperature Reverse-Bias Test. IEEE Access 9: 87697-87705 (2021)

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