"A Per-Test Fault Diagnosis Method Based on the X-Fault Model."

Xiaoqing Wen et al. (2006)

> Home

Details and statistics

DOI: 10.1093/IETISY/E89-D.11.2756

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ieicet/WenKMYSWK06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/WenKMYSWK06
Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Yuta Yamato, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita:
A Per-Test Fault Diagnosis Method Based on the X-Fault Model. IEICE Trans. Inf. Syst. 89-D(11): 2756-2765 (2006)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.