"Efficient testing of SRAM with optimized march sequences and a novel DFT ..."

Qikai Chen et al. (2005)

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DOI: 10.1109/TVLSI.2005.859565

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type: Journal Article

metadata version: 2024-05-07

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Qikai Chen, Hamid Mahmoodi-Meimand, Swarup Bhunia, Kaushik Roy:
Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. IEEE Trans. Very Large Scale Integr. Syst. 13(11): 1286-1295 (2005)

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