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"Analyzing and Increasing Yield of ZnO Thin-Film Transistors for Large-area ..."
Zhiwu Zheng et al. (2019)
- Zhiwu Zheng, Levent E. Aygun, Yoni Mehlman, Sigurd Wagner, Naveen Verma, James C. Sturm:
Analyzing and Increasing Yield of ZnO Thin-Film Transistors for Large-area Sensing Systems by Preventing Process-Induced Gate Dielectric Breakdown. DRC 2019: 141-142
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